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António Pascoal
Instituto Superior Técnico (PT)

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Marco Lovera
Politecnico di Milano (IT)

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Reza Moheimani,
University of Dallas (USA)

Title : From Imaging to Lithography: Control-Enabled Advancements in Scanning Tunneling Microscopy
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Bio : Reza Moheimani is a Professor and James Von Ehr Distinguished Chair in Science and Technology in the Department of Systems Engineering at the University of Texas at Dallas with affiliate appointments in Electrical and Computer Engineering and Mechanical Engineering Departments. He is the past Editor-in-Chief of Mechatronics, and a past associate editor of IEEE Transactions on Control Systems Technology, IEEE Transactions on Mechatronics and Control Engineering Practice. He received the Industrial Achievement Award (IFAC, 2023), Nyquist Lecture Award (ASME DSCD, 2022), Charles Stark Draper Innovative Practice Award (ASME DSCD, 2020), Nathaniel B. Nichols Medal (IFAC, 2014), IEEE Control Systems Technology Award (IEEE CSS, 2009) and IEEE Transactions on Control Systems Technology Outstanding Paper Award (IEEE CSS, 2007 and 2018). He is a Fellow of IEEE, IFAC, ASME and Institute of Physics (UK). Moheimani received the Ph.D. degree in Electrical Engineering from University of New South Wales, Australia in 1996. His current research interests include applications of control and estimation in high-precision mechatronic systems, high-speed scanning probe microscopy and advanced atomically precise manufacturing.

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Valentina Breschi,
LCSL (IT)

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